LEVEL 62 RPI Poli-Si TFT Model

Star-Hspice LEVEL 62 is an AIM-SPICE MOS16 poly-silicon (Poli-Si) thin-film transistor (TFT) model.

Model Features

The AIM-SPICE MOS16 Poli-Si TFT model features include:

Using LEVEL 62 with Star-Hspice

When using the AIM-SPICE MOS16 Poli-Si TFT model:

1. Set LEVEL=62 to identify the model as the AIM-SPICE MOS16 Poli-Si TFT model.

2. The default value for L is 100m, and the default value for W is 100m.

3. The LEVEL 62 model is a 3-terminal model. No bulk node exists; therefore no parasitic drain-bulk or source-bulk diodes are appended to the model. A fourth node can be specified, but does not affect simulation results.

4. The default room temperature is 25oC in Star-Hspice, but is 27oC in some other simulators. The user may choose whether or not to set the nominal simulation temperature to 27oC by adding .OPTION TNOM=27 to the netlist.

Example

This is an example of a Star-Hspice model and element statement modified for use with LEVEL 62:


mckt drain gate source nch L=10e-6 W=10e-6

 

.MODEL nch nmos LEVEL=62

+ asat = 1 at = 3e-8 blk = 0.001 bt = 0.0 cgdo = 0.0

+ cgso = 0.0 dasat = 0.0 dd = 1.4e-7 delta = 4.0

+ dg = 2.0e-7 dmu1 = 0.0 dvt = 0.0 dvto = 0.0 eb = 0.68

 

+ eta = 7 etac0 = 7 etac00 = 0 i0 = 6.0 i00 = 150

 

+ lasat = 0lkink = 19e-6 mc = 3.0 mk = 1.3 mmu = 3.0

+ mu0 = 100 mu1 = 0.0022 mus = 1.0 rd = 0.0 rdx = 0.0

+ rs = 0.0 rsx = 0.0 tnom = 27 tox = 1.0e=7 vfb = -0.1

+ vkink = 9.1 von = 0.0 vto = 0.0

LEVEL 62 Model Parameters

Name

Unit

Default

Description

ASAT

-

1

Proportionality constant of Vsat

AT

m/V

3E-8

DIBL parameter 1

BLK

-

0.001

Leakage barrier lowering constant

BT

m.V

1.9E-6

DIBL parameter 2

CGDO

F/m

0

Gate-drain overlap capacitance per meter channel width

CGSO

F/m

0

Gate-source overlap capacitance per meter channel width

DASAT

1/°C

0

Temperature coefficient of ASAT

DD

m

1400 Å

Vds field constant

DELTA

-

4.0

Transition width parameter

DG

m

2000 Å

Vgs field constant

DMU1

cm2/Vs ° C

0

Temperature coefficient of MU1

DVT

V

0

The difference between VON and the threshold voltage

DVTO

V/°C

0

Temperature coefficient of VTO

EB

EV

0.68

Barrier height of diode

ETA

-

7

Subthreshold ideality factor

ETAC0

-

ETA

Capacitance subthreshold ideality factor at zero drain bias

ETAC00

1/V

0

Capacitance subthreshold coefficient of drain bias

I0

A/m

6.0

Leakage scaling constant

I00

A/m

150

Reverse diode saturation current

LASAT

M

0

Coefficient for length dependence of ASAT

LKINK

M

19E-6

Kink effect constant

MC

-

3.0

Capacitance knee shape parameter

MK

-

1.3

Kink effect exponent

MMU

-

3.0

Low field mobility exponent

MU0

cm2/Vs

100

High field mobility

MU1

cm2/Vs

0.0022

Low field mobility parameter

MUS

cm2/Vs

1.0

Subthreshold mobility

RD

µ

0

Drain resistance

RDX

 

0

Resistance in series with Cgd

RS

µ

0

Source resistance

RSX

 

0

Resistance in series with Cgs

TNOM

°C

25

Parameter measurement temperature

TOX

m

1e-7

Thin-oxide thickness

V0

V

0.12

Characteristic voltage for deep states

VFB

V

-0.1

Flat band voltage

VKINK

V

9.1

Kink effect voltage

VON

V

0

On-voltage

VTO

V

0

Zero-bias threshold voltage

Equivalent Circuit

Model Equations

Drain Current

The expression for the subthreshold current is given by:

 

 

 

 

 

where is the dielectric constant of the oxide and k B is the Boltzmanns constant.

Above threshold ( Vgt > 0), the conduction current is given by:

 

 

Subthreshold leakage current is the result of thermionic field emission of carriers through the grain boundary trap states and is described by:

 

 

 

 

 

 

 

 

 

 

 

 

 

Finally, for very large drain biases, the kink effect is observed. It is modeled as impact ionization in a narrow region near the drain. The expression can be written as:

 

 

The impact ionization current, Ikink , is added to the drain current.

Threshold Voltage

If VTO is not specified:

 

else:

 

Temperature Dependence

 

 

 

Capacitance

 

 

 

 

 

 

 

 

U

Star-Hspice Manual - Release 2001.2 - June 2001