File Name
|
Description
|
Algebraic Output Variable Examples $installdir/demo/hspice/alge
|
alg.sp
|
demonstration of algebraic parameters
|
alg_fil.sp
|
magnitude response of behavioral filter model
|
alg_vco.sp
|
voltage controlled oscillator
|
alg_vf.sp
|
voltage-to-frequency converter behavioral model
|
xalg1.sp
|
QA of parameters
|
xalg2.sp
|
QA of parameters
|
Applications of General Interest $installdir/demo/hspice/apps
|
alm124.sp
|
AC, noise, transient op-amp analysis
|
alter2.sp
|
.ALTER examples
|
ampg.sp
|
pole/zero analysis of a G source amplifier
|
asic1.sp
|
ground bounce for I/O CMOS driver
|
asic3.sp
|
ten-stage lumped MOS model
|
bjt2bit.sp
|
BJT two-bit adder
|
bjt4bit.sp
|
four-bit, all NAND gate binary adder
|
bjtdiff.sp
|
BJT diff amp with every analysis type
|
bjtschmt.sp
|
bipolar Schmidt trigger
|
bjtsense.sp
|
bipolar sense amplifier
|
cellchar.sp
|
ASIC inverter cell characterization
|
crystal.sp
|
crystal oscillator circuit
|
gaasamp.sp
|
simple GaAsFET amplifier
|
grouptim.sp
|
group time delay example
|
inv.sp
|
sweep MOSFET -3 sigma to +3 sigma, use .MEASURE output
|
mcdiff.sp
|
CMOS differential amplifier
|
mondc_a.sp
|
Monte Carlo of MOS diffusion and photolithographic effects
|
mondc_b.sp
|
Monte Carlo DC analysis
|
mont1.sp
|
Monte Carlo Gaussian, uniform, and limit function
|
mos2bit.sp
|
two-bit MOS adder
|
pll.sp
|
phase locked loop
|
sclopass.sp
|
switched capacitor low-pass filter
|
worst.sp
|
worst case skew models using .ALTER
|
xbjt2bit.sp
|
BJT NAND gate two-bit binary adder
|
Behavioral Applications $installdir/demo/hspice/behave
|
acl.sp
|
acl gate
|
amp_mod.sp
|
amplitude modulator with pulse waveform carrier
|
behave.sp
|
AND/NAND gates using G, E Elements
|
calg2.sp
|
voltage variable capacitance
|
det_dff.sp
|
double edge triggered flip-flop
|
diff.sp
|
differentiator circuit
|
diode.sp
|
behavioral diode using a PWL VCCS
|
dlatch.sp
|
CMOS D-latch using behaviorals
|
galg1.sp
|
sampling a sine wave
|
idealop.sp
|
ninth-order low-pass filter
|
integ.sp
|
integrator circuit
|
invb_op.sp
|
optimization of CMOS macromodel inverter
|
ivx.sp
|
characterization of PMOS and NMOS as a switch
|
op_amp.sp
|
op-amp from Chua and Lin
|
pd.sp
|
phase detector modeled by switches
|
pdb.sp
|
phase detector using behavioral NAND gates
|
pwl10.sp
|
operational amplifier used as voltage follower
|
pwl2.sp
|
PPW-VCCS with gain of 1 amp/volt
|
pwl4.sp
|
eight-input NAND gate
|
pwl7.sp
|
modeling inverter by a PWL VCVS
|
pwl8.sp
|
smoothing the triangle waveform by PWL CCCS
|
ring5bm.sp
|
five-stage ring oscillator - macromodel CMOS inverter
|
ringb.sp
|
ring oscillator using behavioral model
|
sampling.sp
|
sampling a sine wave
|
scr.sp
|
silicon controlled rectifier modelled with PWL CCVS
|
swcap5.sp
|
fifth-order elliptic switched capacitor filter
|
switch.sp
|
test for PWL switch element
|
swrc.sp
|
switched capacitor RC circuit
|
triode.sp
|
triode model family of curves using behavioral elements
|
triodex.sp
|
triode model family of curves using behavioral elements
|
tunnel.sp
|
modeling tunnel diode characteristic by PWL VCCS
|
vcob.sp
|
voltage controlled oscillator using PWL functions
|
Benchmarks $installdir/demo/hspice/bench
|
bigmos1.sp
|
large MOS simulation
|
demo.sp
|
quick demo file to test installation
|
m2bit.sp
|
72-transistor two-bit adder - typical cell simulation
|
m2bitf.sp
|
fast simulation example
|
m2bitsw.sp
|
fast simulation example - same as m2bitf.sp but using behavioral elements
|
senseamp.sp
|
bipolar analog test case
|
Timing Analysis $installdir/demo/hspice/bisect
|
fig3a.sp
|
DFF bisection search for setup time
|
fig3b.sp
|
DFF early, optimum, and late setup times
|
inv_a.sp
|
inverter bisection pass-fail
|
BJT and Diode Devices $installdir/demo/hspice/bjt
|
bjtbeta.sp
|
plot BJT beta
|
bjtft.sp
|
plot BJT FT using s-parameters
|
bjtgm.sp
|
plot BJT Gm, Gpi
|
dpntun.sp
|
junction tunnel diode
|
snaphsp.sp
|
convert SNAP to Star-Hspice
|
tun.sp
|
tunnel oxide diode
|
Cell Characterization $installdir/demo/hspice/cchar
|
dff.sp
|
DFF bisection search for setup time
|
inv3.sp
|
inverter characterization
|
inva.sp
|
inverter characterization
|
invb.sp
|
inverter characterization
|
load1.sp
|
inverter sweep, delay versus fanout
|
setupbsc.sp
|
setup characterization
|
setupold.sp
|
setup characterization
|
setuppas.sp
|
setup characterization
|
sigma.sp
|
sweep MOSFET -3 sigma to +3 sigma, use measure output
|
tdgtl.a2d
|
Viewsim A2D Star-Hspice input file
|
tdgtl.d2a
|
Viewsim D2A Star-Hspice input file
|
tdgtl.sp
|
two-bit adder using D2A Elements
|
Circuit Optimization $installdir/demo/hspice/ciropt
|
ampgain.sp
|
set unity gain frequency of BJT diff pair
|
ampopt.sp
|
optimize area, power, speed of MOS amp
|
asic2.sp
|
optimize speed, power of CMOS output buffer
|
asic6.sp
|
find best width of CMOS input buffer
|
delayopt.sp
|
optimize group delay of LCR circuit
|
lpopt.sp
|
match lossy filter to ideal filter
|
opttemp.sp
|
find first and second temperature coefficients of resistor
|
rcopt.sp
|
optimize speed, power for RC circuit
|
DDL $installdir/demo/hspice/ddl
|
ad8bit.sp
|
eight-bit A/D flash converter
|
alf155.sp
|
National JFET op-amp characterization
|
alf156.sp
|
National JFET op-amp characterization
|
alf157.sp
|
National JFET op-amp characterization
|
alf255.sp
|
National JFET op-amp characterization
|
alf347.sp
|
National JFET op-amp characterization
|
alf351.sp
|
National wide bandwidth JFET input op-amp characterization
|
alf353.sp
|
National wide bandwidth dual JFET input op-amp char.
|
alf355.sp
|
Motorola JFET op-amp characterization
|
alf356.sp
|
Motorola JFET op-amp characterization
|
alf357.sp
|
Motorola JFET op-amp characterization
|
alf3741.sp
|
|
alm101a.sp
|
|
alm107.sp
|
National op-amp characterization
|
alm108.sp
|
National op-amp characterization
|
alm108a.sp
|
National op-amp characterization
|
alm118.sp
|
National op-amp characterization
|
alm124.sp
|
National low power quad op-amp characterization
|
alm124a.sp
|
National low power quad op-amp characterization
|
alm158.sp
|
National op-amp characterization
|
alm158a.sp
|
National op-amp characterization
|
alm201.sp
|
LM201 op-amp characterization
|
alm201a.sp
|
LM201 op-amp characterization
|
alm207.sp
|
National op-amp characterization
|
alm208.sp
|
National op-amp characterization
|
alm208a.sp
|
National op-amp characterization
|
alm224.sp
|
National op-amp characterization
|
alm258.sp
|
National op-amp characterization
|
alm258a.sp
|
National op-amp characterization
|
alm301a.sp
|
National op-amp characterization
|
alm307.sp
|
National op-amp characterization
|
alm308.sp
|
National op-amp characterization
|
alm308a.sp
|
National op-amp characterization
|
alm318.sp
|
National op-amp characterization
|
alm324.sp
|
National op-amp characterization
|
alm358.sp
|
National op-amp characterization
|
alm358a.sp
|
National op-amp characterization
|
alm725.sp
|
National op-amp characterization
|
alm741.sp
|
National op-amp characterization
|
alm747.sp
|
National op-amp characterization
|
alm747c.sp
|
National op-amp characterization
|
alm1458.sp
|
National dual op-amp characterization
|
alm1558.sp
|
National dual op-amp characterization
|
alm2902.sp
|
National op-amp characterization
|
alm2904.sp
|
National op-amp characterization
|
amc1458.sp
|
Motorola internally compensated high performance op-amp characterization
|
amc1536.sp
|
Motorola internally compensated high voltage op-amp characterization
|
amc1741.sp
|
Motorola internally compensated high performance op-amp characterization
|
amc1747.sp
|
Motorola internally compensated high performance op-amp characterization
|
ane5534.sp
|
TI low noise, high speed op-amp characterization
|
anjm4558.sp
|
TI dual op-amp characterization
|
anjm4559.sp
|
TI dual op-amp characterization
|
anjm4560.sp
|
TI dual op-amp characterization
|
aop04.sp
|
PMI op-amp characterization
|
aop07.sp
|
PMI ultra low offset voltage op-amp characterization
|
aop14.sp
|
PMI op-amp characterization
|
aop15b.sp
|
PMI precision JFET input op-amp characterization
|
aop16b.sp
|
PMI precision JFET input op-amp characterization
|
at094cns.sp
|
TI op-amp characterization
|
atl071c.sp
|
TI low noise op-amp characterization
|
atl072c.sp
|
TI low noise op-amp characterization
|
atl074c.sp
|
TI low noise op-amp characterization
|
atl081c.sp
|
TI JFET op-amp characterization
|
atl082c.sp
|
TI JFET op-amp characterization
|
atl084c.sp
|
TI JFET op-amp characterization
|
atl092cp.sp
|
TI op-amp characterization
|
atl094cn.sp
|
TI op-amp characterization
|
aupc358.sp
|
NEC general dual op-amp characterization
|
aupc1251.sp
|
NEC general dual op-amp characterization
|
j2n3330.sp
|
JFET 2n3330 I-V characteristics
|
mirf340.sp
|
IRF340 I-V characteristics
|
t2n2222.sp
|
BJT 2n2222 characterization
|
Device Optimization $installdir/demo/hspice/devopt
|
beta.sp
|
LEVEL=2 beta optimization
|
bjtopt.sp
|
s-parameter optimization of 2n6604 BJT
|
bjtopt1.sp
|
2n2222 DC optimization
|
bjtopt2.sp
|
2n2222 Hfe optimization
|
d.sp
|
diode, multiple temperatures
|
dcopt1.sp
|
1n3019 diode I-V and C-V optimization
|
gaas.sp
|
JFET optimization
|
jopt.sp
|
300u/1u GaAs FET DC optimization
|
jopt2.sp
|
JFET optimization
|
joptac.sp
|
300u/1u GaAs FET 40 MHz-20 GHz s-parameter optimization
|
l3.sp
|
MOS LEVEL 3 optimization
|
l3a.sp
|
MOS LEVEL 3 optimization
|
l28.sp
|
LEVEL=28 optimization
|
ml2opt.sp
|
MOS LEVEL=2 I-V optimization
|
ml3opt.sp
|
MOS LEVEL=3 I-V optimization
|
ml6opt.sp
|
MOS LEVEL=6 I-V optimization
|
ml13opt.sp
|
MOS LEVEL=13 I-V optimization
|
opt_bjt.sp
|
2n3947 forward and reverse Gummel optimization
|
Fourier Analysis $installdir/demo/hspice/fft
|
am.sp
|
FFT analysis, AM source
|
bart.sp
|
FFT analysis, Bartlett window
|
black.sp
|
FFT analysis, Blackman window
|
dist.sp
|
FFT analysis, second harmonic distortion
|
exam1.sp
|
FFT analysis, AM source
|
exam3.sp
|
FFT analysis, high frequency signal detection test
|
exam4.sp
|
FFT analysis, small-signal harmonic distortion test
|
exp.sp
|
FFT analysis, exponential source
|
fft.sp
|
FFT analysis, transient, sweeping a resistor
|
fft1.sp
|
FFT analysis, transient
|
fft2.sp
|
FFT analysis on the product of three waveforms
|
fft3.sp
|
FFT analysis, transient, sweeping frequency
|
fft4.sp
|
FFT analysis, transient, Monte Carlo Gaussian distribution
|
fft5.sp
|
FFT analysis, data-driven transient analysis
|
fft6.sp
|
FFT analysis, sinusoidal source
|
gauss.sp
|
FFT analysis, Gaussian window
|
hamm.sp
|
FFT analysis, Hamming window
|
hann.sp
|
FFT analysis, Hanning window
|
harris.sp
|
FFT analysis, Blackman-Harris window
|
intermod.sp
|
FFT analysis, intermodulation distortion
|
kaiser.sp
|
FFT analysis, Kaiser window
|
mod.sp
|
FFT analysis, modulated pulse
|
pulse.sp
|
FFT analysis, pulse source
|
pwl.sp
|
FFT analysis, piecewise linear source
|
rect.sp
|
FFT analysis, rectangular window
|
rectan.sp
|
FFT analysis, rectangular window
|
sffm.sp
|
FFT analysis, single-frequency FM source
|
sine.sp
|
FFT analysis, sinusoidal source
|
swcap5.sp
|
FFT analysis, fifth-order elliptic switched capacitor filter
|
tri.sp
|
FFT analysis, rectangular window
|
win.sp
|
FFT analysis, window test
|
window.sp
|
FFT analysis, window test
|
winreal.sp
|
FFT analysis, window test
|
Filters $installdir/demo/hspice/filters
|
fbp_1.sp
|
bandpass LCR filter measurement
|
fbp_2.sp
|
bandpass LCR filter pole/zero
|
fbpnet.sp
|
bandpass LCR filter s-parameters
|
fbprlc.sp
|
LCR AC analysis for resonance
|
fhp4th.sp
|
high-pass LCR fourth-order Butterworth filter
|
fkerwin.sp
|
pole/zero analysis of Kerwin's circuit
|
flp5th.sp
|
low-pass fifth-order filter
|
flp9th.sp
|
low-pass ninth-order FNDR with ideal op-amps
|
micro1.sp
|
test of microstrip
|
micro2.sp
|
test of microstrip
|
tcoax.sp
|
test of RG58/AU coax
|
trans1m.sp
|
FR-4 printed circuit lumped transmission line
|
Magnetics $installdir/demo/hspice/mag
|
aircore.sp
|
air core transformer circuit
|
bhloop.sp
|
b-h loop nonlinear magnetic core transformer
|
mag2.sp
|
three primary, two secondary magnetic core transformer
|
magcore.sp
|
magnetic core transformer circuit
|
royerosc.sp
|
Royer magnetic core oscillator
|
MOSFET Devices $installdir/demo/hspice/mos
|
bsim3.sp
|
LEVEL=47 BSIM3 model
|
cap13.sp
|
plot MOS capacitances LEVEL=13 model
|
cap_b.sp
|
capacitances for LEVEL=13 model
|
cap_m.sp
|
capacitance for LEVEL=13 model
|
capop0.sp
|
plot MOS capacitances LEVEL=2
|
capop1.sp
|
plot MOS capacitances LEVEL=2
|
capop2.sp
|
plot MOS capacitances LEVEL=2
|
capop4.sp
|
plot MOS capacitances LEVEL=6
|
chrgpump.sp
|
charge conservation test LEVEL=3
|
iiplot.sp
|
impact ionization current plot
|
ml6fex.sp
|
plot temperature effects LEVEL=6
|
ml13fex.sp
|
plot temperature effects LEVEL=13
|
ml13ft.sp
|
s-parameters for LEVEL=13
|
ml13iv.sp
|
plot I-V for LEVEL=13
|
ml27iv.sp
|
plot I-V for LEVEL=27 SOSFET
|
mosiv.sp
|
plot I-V for user include file
|
mosivcv.sp
|
plot I-V and C-V for LEVEL=3
|
qpulse.sp
|
charge conservation test LEVEL=6
|
qswitch.sp
|
charge conservation test LEVEL=6
|
selector.sp
|
automatic width and length model selector
|
tgam2.sp
|
LEVEL=6 gamma model
|
tmos34.sp
|
MOS LEVEL=34 EPFL, test DC
|
Peripheral Component Interconnect $installdir/demo/hspice/pci
|
pci_lab.sp
|
Intel Peripheral Component Interconnect demonstration
|
pci_mont.sp
|
PCI Monte Carlo example
|
pci_wc.sp
|
PCI worst-case modeling
|
Radiation Effects $installdir/demo/hspice/rad
|
brad1.sp
|
bipolar radiation effects example
|
brad2.sp
|
bipolar radiation effects example
|
brad3.sp
|
bipolar radiation effects example
|
brad4.sp
|
bipolar radiation effects example
|
brad5.sp
|
bipolar radiation effects example
|
brad6.sp
|
bipolar radiation effects example
|
drad1.sp
|
diode radiation effects example
|
drad2.sp
|
diode radiation effects example
|
drad4.sp
|
diode radiation effects example
|
drad5.sp
|
diode radiation effects example
|
drad6.sp
|
diode radiation effects example
|
dradarb2.sp
|
diode radiation effects example
|
jex1.sp
|
JFET radiation effects example
|
jex2.sp
|
JFET radiation effects example
|
jprad1.sp
|
JFET radiation effects example
|
jprad2.sp
|
JFET radiation effects example
|
jprad4.sp
|
JFET radiation effects example
|
jrad1.sp
|
JFET radiation effects example
|
jrad2.sp
|
JFET radiation effects example
|
jrad3.sp
|
JFET radiation effects example
|
jrad4.sp
|
JFET radiation effects example
|
jrad5.sp
|
JFET radiation effects example
|
jrad6.sp
|
JFET radiation effects example
|
mrad1.sp
|
MOSFET radiation effects example
|
mrad2.sp
|
MOSFET radiation effects example
|
mrad3.sp
|
MOSFET radiation effects example
|
mrad3p.sp
|
MOSFET radiation effects example
|
mrad3px.sp
|
MOSFET radiation effects example
|
rad1.sp
|
total MOSFET dose example
|
rad2.sp
|
diode photocurrent test circuit
|
rad3.sp
|
diode photocurrent test circuit RLEV=3
|
rad4.sp
|
diode photocurrent test circuit
|
rad5.sp
|
BJT photocurrent test circuit with an NPN transistor
|
rad6.sp
|
BJT secondary photocurrent effect which varies with R1
|
rad7.sp
|
BJT RLEV=6 example (semi-empirical model)
|
rad8.sp
|
JFET RLEV=1 example with Wirth-Rogers square pulse
|
rad9.sp
|
JFET stepwise increasing radiation source
|
rad10.sp
|
GaAs RLEV=5 example (semi-empirical model)
|
rad11.sp
|
NMOS E-mode LEVEL=8 with Wirth-Rogers square pulse
|
rad12.sp
|
NMOS 0.5x resistive voltage divider
|
rad13.sp
|
three-input NMOS NAND gate with non-EPI, EPI, and SOS examples
|
rad14.sp
|
GaAs differential amplifier circuit
|
rad14dc.sp
|
n-channel JFET DC I-V curves
|
Sources $installdir/demo/hspice/sources
|
amsrc.sp
|
amplitude modulation
|
exp.sp
|
exponential independent source
|
pulse.sp
|
test of pulse
|
pwl.sp
|
repeated piecewise linear source
|
pwl10.sp
|
op-amp voltage follower
|
rtest.sp
|
voltage controlled resistor inverter chain
|
sffm.sp
|
single frequency FM modulation source
|
sin.sp
|
sinusoidal source waveform
|
vcr1.sp
|
switched capacitor network using G-switch
|
Transmission Lines $installdir/demo/hspice/tline
|
fr4.sp
|
microstrip test FR-4 PC board material
|
fr4o.sp
|
optimizing model for microstrip FR-4 PC board material
|
fr4x.sp
|
FR4 microstrip test
|
hd.sp
|
ground bounce for I/O CMOS driver
|
rcsnubts.sp
|
ground bounce for I/O CMOS driver at snubber output
|
rcsnubtt.sp
|
ground bounce for I/O CMOS driver
|
strip1.sp
|
two series microstrips (8 mil and 16 mil wide)
|
strip2.sp
|
two microstrips coupled together
|
t14p.sp
|
1400 mil by 140 mil, 50 ohm tline on FR-4 50 MHz - 10.05 GHz
|
t14xx.sp
|
1400 mil by 140 mil, 50 ohm tline on FR-4 optimization
|
t1400.sp
|
1400 mil by 140 mil, 50 ohm tline on FR-4 optimization
|
tcoax.sp
|
RG58/AU coax with 50 ohm termination
|
tfr4.sp
|
microstrip test
|
tfr4o.sp
|
microstrip test
|
tl.sp
|
series source coupled and shunt terminated transmission lines
|
transmis.sp
|
algebraics and lumped transmission lines
|
twin2.sp
|
twinlead model
|
xfr4.sp
|
microstrip test subcircuit expanded
|
xfr4a.sp
|
microstrip test subcircuit expanded, larger ground resistance
|
xfr4b.sp
|
microstrip test
|
xulump.sp
|
test 5-, 20-, and 100-lump U models
|