Research Activities
Ph.D.'s:
Industry:
- LSI: ISQED 2003 (Design for Quality Meeting)
Presentation: "Design and Use of Memory-Specific Test Structures to
Ensure SRAM Yield and Manufacturability"
-
AMD: IRWS.2006 (IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP):
Paper: Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests",
References:
Dimitri:
New book
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