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IC 文章精选

 

人力资源 设备科 资产处 人事信息  课程  prp 毕业设计。

http://mnri.sjtu.edu.cn/

http://yfzhang.sjtu.edu.cn/

http://ic.sjtu.edu.cn/

PRP

 如何读研究生?研究生导师怎么做?
 如何读写科技/工程文章

 

 

recearch work publications and patents(all till 2017)of Franklin Li Duan

from: http://www.scholarmate.com/scmwebsns/pv/liduan16 and http://xueshu.baidu.com/

 


英文文章

Gao, Junchao; *Duan, Franklin Li; Yu, Chang; Meng, Wentao; Liu, Lizuo; Ding, Guifu; Zhang, Congchun; Wang, Ying, Electrical insulation of ceramic thin film on metallic aero-engine blade for high temperature sensor applications, Ceramics International, 42(16), pp 19269-19275, 2016/12.

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Niu, Di; Wang, Qiang; *Zhang, Congchun; *Cheng, Ping; Wang, Yanlei; Zhang, Jiubin; Ding, Guifu; Xie, Kaisheng; Shao, Jing; Liu, Yishen; Duan, Li, Preparation, characterization and application of high-temperature Al2O3 insulating film, Surface and Coatings Technology, 271卷, pp 318-324, 2016/4/15.

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Han, Jie; *Cheng, Ping; Wang, Hong; Zhang, Congchun; Zhang, Jiubin; Wang, Yan; Duan, Li; Ding, Guifu, MEMS-based Pt film temperature sensor on an alumina substrate, Materials Letters, 125卷, pp 224-226, 2014/6/15.

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Zhang, Yafei; Duan, Li Franklin; Zhang, Yaozhong; Wang, Jian; Geng, Huijuan; *Zhang, Qing, Advances in Conceptual Electronic Nanodevices based on 0D and 1D Nanomaterials, Nano-Micro Letters, 6(1), pp 1-19, 2014.

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*Duan, Franklin; Cooper, Stephen; Marathe, Amit; Zhang, John; Jayanarayanan, Sankaran Kartik, Impact of monitoring voltage on the lifetime extrapolation during the accelerated degradation tests, IEEE International Integrated Reliability Workshop, 2006/10/16-2006/10/19, pp 139-+, S Lake Tahoe, CA, 2006.

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*Duan, FL; Sinha, SP; Ioannou, DE; Brady, FT, LDD design tradeoffs for single transistor latch-up and hot carrier degradation control in accumulation mode FD SOI MOSFET's, IEEE Transactions on Electron Devices, 44(6), pp 972-977, 1997/6.

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Y Liu  Y Shen  F Duan , ... -  《Vacuum》  -  2017  -  被引量:  0
Solidly mounted resonators fabricated for GHz frequency applications based on Mg x Zn 1-x O piezoelectric film
来源: Elsevier   /  infona.pl


中文文章

应用于航空发动机涡轮叶片的热障涂层材料研究

李磊段力秦格华 , ... -  《功能材料》  -  2017  -  被引量:  0
上海交通大学段力上海交通大学电子信息与电气工程学院秦格华上海交通大学电子信息与电气工程学院薄膜与微细加工技术教育部重点实验室江苏利达高科特种材料有限公司...

MgxZn1-xO压电薄膜表面粗糙度对SMR性能的影响

... 刘一剑杨翰林段力 , ... -  《微纳电子技术》  -  2014  -  被引量:  0
上海交通大学电子信息与电气工程学院段力上海交通大学电子信息与电气工程学院张亚非上海交通大学微纳科学技术研究院薄膜与微细技术教育部重点实验室《微纳电子技术...
来源: 维普  /  万方  /  知网  /  爱学术 (全网免费下载)

微型碳纳米管NH_3气体检测系统

梁艳涛段力杨志 , ... -  《传感器与微系统》  -  2015  -  被引量:  0
段力上海交通大学电子信息与电气工程学院杨志薄膜与微细技术教育部重点实验室张亚非上海交通大学微纳科学技术研究院薄膜与微细技术教育部重点实验室《传感器与微系...
来源: 知网  /  维普  /  万方  /  道客巴巴 (账号登陆免费)  /  爱学术 (全网免费下载)

高温薄膜传感器制备与性能研究

... 程萍丁桂甫段力  -  《传感器与微系统》  -  2016  -  被引量:  0
上海中航商用航空发动机制造有限责任公司邵靖上海交通大学电子信息与电气工程学院上海交通大学上海中航商用航空发动机制造有限责任公司程萍上海中航商用航空发动机...
来源: 知网  /  万方  /  维普

基于Mg_xZn_(1-x)O薄膜固体装配型体声波谐振器

汪军段力刘一剑 , ... -  《应用声学》  -  2016  -  被引量:  0
上海交通大学电子信息与电气工程学院段力上海交通大学电子信息与电气工程学院刘一剑上海交通大学电子信息与电气工程学院苏言杰上海交通大学电子信息与电气工程学院...
来源: 知网  /  万方  /  维普  /  yysx.cnjournals.cn (全网免费下载)  /  爱学术 (全网免费下载)

以空气为介质的低热导率材料研究

李磊段力秦格华 , ... -  《材料保护》  -  2016  -  被引量:  0
上海交通大学电子信息与电气工程学院秦格华上海交通大学电子信息与电气工程学院薄膜与微细加工技术教育部重点实验室江苏利达高科特种材料有限公司马德川上海交通大...
来源: 知网

氧化锌系列薄膜体声波谐振器研制与表征

段力卢学良史丽云 , ... -  《微纳电子技术》  -  2016  -  被引量:  0
上海交通大学电子信息与电气工程学院卢学良上海交通大学电子信息与电气工程学院史丽云上海交通大学电子信息与电气工程学院王英上海交通大学电子信息与电气工程学院...
来源: 维普  /  万方  /  知网  /  爱学术 (全网免费下载)

PDMS软模板制备与叶片曲表面软光刻工艺

高均超段力王英 , ... -  《微纳电子技术》  -  2016  -  被引量:  0
上海交通大学电子信息与电气工程学院上海交通大学上海中航商用航空发动机制造有限责任公司段力上海中航商用航空发动机制造有限责任公司王英上海交通大学电子信息与...
来源: 万方  /  知网  /  维普

掺镁ZnO基薄膜体声波谐振器的制备和性能研究

卢学良段力刘一剑 , ... -  《压电与声光》  -  2017  -  被引量:  0
上海交通大学电子信息与电气工程学院段力上海交通大学电子信息与电气工程学院刘一剑上海交通大学电子信息与电气工程学院汪军上海交通大学电子信息与电气工程学院张...
来源: 维普  /  知网  /  万方  /  《压电与声光》官网 (全网免费下载)  /  airitilibrary.com

 

高温复合多层膜结构传感器的热机械可靠性

李洪美孙云娜 段力 , ... -  《仪表技术与传感器》  -  2015  -  被引量:  0
上海交通大学微纳科学技术研究院丁桂甫上海中航商用航空发动机制造有限责任公司张久斌上海中航商用航空发动机制造有限责任公司牛迪上海中航商用航空发动机制造有限...
来源: 维普  /  知网  /  万方  /  爱学术 (全网免费下载)

亚分辨率辅助图形对28纳米密集线条光刻成像的影响

陈权 段力毛智彪  -  《中国集成电路》  -  2016  -  被引量:  0
doi:10.3969/j.issn.1681-5289.2016.05.008陈权上海交通大学上海上海华力微电子有限公司段力上海交通大学毛智彪上海华力微电子有限公司中国集成电路...
来源: 万方  /  维普  /  知网  /  百度文库 (账号登陆免费)  /  爱学术 (全网免费下载)
 

基于0.18μm CMOS工艺实现无EPI新型LDMOS器件

许贻梅 段力钱文生  -  《集成电路应用》  -  2017  -  被引量:  0
许贻梅上海交通大学微纳电子学院上海上海华虹宏力半导体制造有限公司段力上海交通大学电子信息与电气工程学院钱文生上海华虹宏力半导体制造有限公司集成电路应用...
来源: 维普  /  万方
批量引用  引用收藏

 

高均超; 段力; 王英; 刘民; 王凤丹; 丁桂甫; 王强; 郑芳芳; 邵靖, PDMS软模板制备与叶片曲表面软光刻工艺, 微纳电子技术, 05期, pp 333-339, 2016/4.

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卢学良; *段力; 刘一剑; 汪军; 张亚非, 掺镁ZnO基薄膜体声波谐振器的制备和性能研究简, 压电与声光, 01期, pp 11-14+18, 2017/2/15.

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段力; 卢学良; 史丽云; 王英; 付学成; 王丹凤; 汪军; 沈勇; 翁昊天; 张亚非, 氧化锌系列薄膜体声波谐振器研制与表征, 微纳电子技术, 11期, pp 726-730, 2016/10.

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王强; 张久斌; 邵靖; 程萍; 丁桂甫; 段力, 高温薄膜传感器制备与性能研究, 传感器与微系统, 11期, pp 33-35+39, 2016/10.

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Wang, Yanlei; *Zhang, Congchun; Niu, Di; Ding, Guifu; Duan, Li, High temperature sensors fabricated on Al2O3 ceramic and nickel-based superalloy substrates, Sensors and Actuators A: Physical, 247卷, pp 75-82, 2016/8/15.

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汪军; 段力; 刘一剑; 苏言杰; 沈勇; 卢学良; 张亚非, 基于MgxZn1-xO薄膜固体装配型体声波谐振器, 应用声学, 03期, pp 212-218, 2016/5.

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王强; 张久斌; 邵靖; 程萍; 丁桂甫; *段力, 高温薄膜传感器制备与性能研究, 传感器与微系统, 35(11), pp 222-227, 2016.

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汪军; *段力; 刘一剑; 苏言杰; 沈勇; 卢学良; 张亚非, 基于MgxZn1-xO薄膜固体装配型体声波谐振器, 应用声学, 35(3), pp 111-122, 2016.

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陈权; 段力; 毛智彪, 亚分辨率辅助图形对28纳米密集线条光刻成像的影响, 中国集成电路, 25(5), 2016.

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梁艳涛; 段力; 杨志; 张亚非, 微型碳纳米管NH3气体检测系统, 传感器与微系统, 08期, pp 91-93, 2015/8/20.

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段力; 高均超; 丁桂甫; 汪红; 邵靖; 刘宜胜; 李洪美; 王凤森; 张永强; 杨卓青; 赵小林; 程萍; 张丛春; 王艳; 戴旭涵, 利用软质光刻模板进行曲面薄膜图形化微制造方法, 上海, CN201510051991.0.

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李洪美; 孙云娜; 段力; 王艳; 丁桂甫; 张久斌; 牛迪, 高温复合多层膜结构传感器的热机械可靠性, 仪表技术与传感器, 11期, 2015.

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沈勇; 刘一剑; 杨翰林; 段力; 张亚非, MgxZn1-xO压电薄膜表面粗糙度对SMR性能的影响, 微纳电子技术, 12期, pp 776-779+784, 2014/12/15.

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早期文章

A Study of the Hot Carrier Degradation of 90 nm node SOI and Bulk Technologies

F Duan  S Cooper  A Marathe , ...  -  被引量:  0
Abstract: A comparative study is undertaken of the hot carrier degradation of 90 nm node bulk and SOI technologies. The floating body effect on the drive current and the electric field leads to slightly higher degradation for the SOI ...
来源: km2000.us 

Reduced soft error rate (SER) construction for integrated circuit structures

... W Kong  L Phan  F Duan , ... -  2002  -  被引量:  0
An integrated circuit structures such as an SRAM construction wherein the soft error rate is reduced comprises an integrated circuit structure formed in a semiconductor substrate, wherein at least one N channel transistor is built in ...
来源: ResearchGate  /  ResearchGate 

LDD design tradeoffs for single transistor latch-up and hot carrier degradation control in accumulation mode FD SOI MOSFET's

FL Duan  SP Sinha  DE Ioannou , ... -  1997  -  被引量:  15
Abstract An experimental study has been conducted of the design tradeoffs of fully-depleted (FD) accumulation mode Silicon-on-Insulator (SOI) MOSFET's w...

 STUDIES ON CHANNEL COUPLING AND FLOATING BODY EFFECTS AND THEIR IMPACTS ON DEVICE PERFORMANCE AND RELIABILITY IN SOI MOSFET

FL Duan  -  被引量:  0
SOI MOSFET is one of the promising options for the future VLSI market due to its low power/high speed character and simplified technology with increased packing density. Yet some problems in device physics must be fully understood bef...
来源: km2000.us 

Electrical Insulation of Ceramic Thin Film on Metallic Aero-Engine Blade for High Temperature Sensor Applications

J Gao  FL Duan  C Yu , ... -  《Ceramics Interna...  -  2016  -  被引量:  0
Fabricating sensor devices directly on metallic component requires the use of an electrical insulating ceramic layer between the sensor and the metal. H...
来源: ResearchGate  /  dx.doi.org  /  infona.pl

Review on Signal Detection of Low DC Current in Nanodevices and Various Sensors

Y Liang  J Chen  FL Duan , ... -  2015  -  被引量:  0
Review on Signal Detection of Low DC Current in Nanodevices and Various Sensorsdoi:10.11605/mee-1-1Yantao LiangJiapin ChenFranklin Li DuanDong XuJun WangHanling YangYafei Zhang...
来源: ResearchGate  /  meej.org

 CHANNEL COUPLING IMPOSED TRADEOFFS ON HOT AND SINGLE TRANSISTOR LATCH-UP IN DEGRADAT ET'S

FL Duan  DE Ioannou  WC Jenkins , ...  -  被引量:  0
Carrier generation by impact ionization in SO1 MOSFET's as a fimction of the strength of channel coupling, adjusted by varying the back gate bias or the silicon film thickness, was extensively studied by extensive PISCES numerical sim...
来源: ResearchGate   /  km2000.us 

 Single channel four transistor SRAM

... R Venkatraman  YC Liu  F Duan , ... -  US  -  2002  -  被引量:  8
A method of forming a memory cell according to the present invention. A first pass gate transistor is formed of a first transistor type. The first pass gate transistor has a gate oxide with a first thickness. The source of the first p...
来源: FreePatentsOnline  /  Google Patents

 Method and apparatus for characterizing shared contacts in high-density SRAM cell design

F Duan  S Ramesh  R Castagnetti  -  US  -  2005  -  被引量:  7
Test structures are provided for accurately quantifying shared contact resistance. The test structures are built based upon an actual memory cell, which is self-aligning to allow shared contact chains through an array of test cells. A...
来源: FreePatentsOnline  /  Google Patents

 Test structures in unused areas of semiconductor integrated circuits and methods for designing the same

F Duan  M Ardans  J Song  -  US  -  2007  -  被引量:  6
The present invention is test structures in unused areas of semiconductor integrated circuits and methods for designing the same. In an exemplary aspect of the present invention, a method for placing test structures in a semiconductor...
来源: FreePatentsOnline  /  Google Patents

 New methodology to measure many more transistors on the same test area

F Duan  M Liu  J Walker , ... -  US  -  2005  -  被引量:  2
A test methodology which provides that test structures, such as transistors, are arranged in a plurality of rows. A logic circuit controls which row is to be measured. An incrementer receives a triggering signal and functions as an ad...
来源: FreePatentsOnline  /  Google Patents

 Device Performance and Reliability in SOI MOSFET

F Duan  -  LAP LAMBERT Acade...  -  2012  -  被引量:  0
SOI MOSFET is one of the promising options for the future VLSI market due to its low power/high speed character and simplified technology with increased...
来源: morebooks.de

 Methodology to measure many more transistors on the same test area

F Duan  M Liu  J Walker , ... -  US  -  2007  -  被引量:  0
A test methodology which provides that test structures, such as transistors, are arranged in a plurality of rows. A logic circuit controls which row is to be measured. An incrementer receives a triggering signal and functions as an ad...
来源: FreePatentsOnline  /  Google Patents

Reduced soft error rate (SER) construction for integrated circuit structures

... W Kong  L Phan  F Duan , ... -  US  -  2002  -  被引量:  14
An integrated circuit structures such as an SRAM construction wherein the soft error rate is reduced comprises an integrated circuit structure formed in a semiconductor substrate, wherein at least one N channel transistor is built in ...
来源: FreePatentsOnline  /  Google Patents  /  ResearchGate 

Single channel four transistor SRAM

... R Venkatraman  YC Liu  F Duan , ... -  2002  -  被引量:  1
A method of forming a memory cell according to the present invention. A first pass gate transistor is formed of a first transistor type. The first pass gate transistor has a gate oxide with a first thickness. The source of the first p...
来源: deepdyve.com

 Compositions and methods for treating endocrine, gastrointestinal or autoimmune disorders

JC March  FF Duan  -  US  -  2016  -  被引量:  0
Recombinant cells and methods are provided that relate to the use of isolated, engineered recombinant cells to directly or indirectly treat diseases or disorders in a mammalian host such as endocrine, gastrointestinal or autoimmune di...
来源: FreePatentsOnline  /  Google Patents

 Commensal bacteria as signal mediators within a mammalian host

JC March  FF Duan  -  US  -  2014  -  被引量:  0
Genetically engineered cells and microorganisms are provided for preventing or ameliorating diseases through genetically engineered quorum signaling. Therapeutic methods for using the cells and microorganisms to prevent or ameliorate ...
来源: FreePatentsOnline  /  Google Patents  /  data.epo.org 

 Method and architecture for detecting random and systematic transistor degradation for transistor reliability evaluation in high-den...

FL Duan  S Ramesh  R Castagnetti  -  US  -  2005  -  被引量:  1
A self-aligning memory cell design is provided to allow testing of transistors in every cell of a memory circuit. A test array of these cells is fabricated with contact pads in each cell for specific components in the cell. Then, meta...
来源: FreePatentsOnline  /  Google Patents

Test structures in unused areas of semiconductor integrated circuits and methods for designing the same

Duan  Franklin  -  2007  -  被引量:  1
The present invention is test structures in unused areas of semiconductor integrated circuits and methods for designing the same. In an exemplary aspect of the present invention, a method for placing test structures in a semiconductor...
来源: patents.com  /  en.zl50.com

Opposite-channel-based injection of hot-carriers in SOI MOSFET's: physics and applications

DE Ioannou  FL Duan  SP Sinha , ... -  《IEEE Transaction...  -  1998  -  被引量:  39
IEEE Xplore. Delivering full text access to the world's highest quality technical literature in engineering and technology.... Duan Franklin L, Sinha Sh...
来源: IEEEXplore  /  adsabs.harvard.edu  /  ingentaconnect.com  /  ResearchGate  / mendeley.com

 

 

Ph.D.'s:
Industry:
  • LSI: ISQED 2003 (Design for Quality Meeting)  Presentation: "Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability"
  • AMD: IRWS.2006 (IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP): Paper: Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests",
References:
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微纳米,微电子,清华,师大,北航,的pdf

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