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1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
October 24 - 25, 1996
Washington, DC
p. 50 Low Cost Test Solution for IDDQ
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Bob Thomas, Rick Andlauer, Cadence Design Systems, Inc.

This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.
 
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