MOSFET, device, CMOS process & technology, reliability, DOE

• MOSFET Devices
• Technology Process
• Reliability Quality
• DOE Taguchi
• Simulation EDA
• SRAM
• FPGA
• High K Metal Gate
• Strained silicon
• Copper Damascene

半导体

• Web-based resource reliability engineering
• CMOS DEVICE RELIABILITY OVERVIEW
• HCI and NBTI Thesis
• HCI and NBTI Reliability Impact on Submicron IC Design
• NSF Educational Video: What is nanotechnology?
• memory 
• IRTS Road Map:  
• Stanford EE Class Material:  
• Patent search: 
• IBM research resources
• Sze
• 半导体技术天地[Semiconductor Technology World]

Stanford Resources: http://www.km2000.us/articles/collectedtopics.htm 

Solid State Circuit Soc. / IEEE: http://www.ewh.ieee.org/soc/sscs/chapter.htm

IC knowledge: http://www.icknowledge.com/

Bay Area Engineer 'GRID': http://www.ee.com/grid/grid04.01/sum.htm

EE Times: http://www.eetimes.com/salarysurvey/2000/default.html

IMEC: http://imec.be/wwwinter/mediacenter/en/SR2006/681414.html

Dr. Shur's (RPI) Semiconductor Resources: http://nina.ecse.rpi.edu/shur/

Nano Structure Conf.: jobresources/nsf_etc.htm

US Research Resources: jobresources/nsf_etc.htm

IEEE Explorer Resources: http://ieeexplore.ieee.org/Xref/DynWel.jsp

Physics Resources: http://mastep.sjsu.edu/resources/physics.htm

Finding area code in US: http://www.mmiworld.com/codelist.htm

Patent / Interlecture Property: http://www.delphion.com/

Face interview http://www.manchester.edu/OSD/Career/pages/Interviewing.html

HSPICE manual  http://www.ece.cmu.edu/~ee762/hspice-docs/html/hspice_and_qrg/index.html  | 

SPC http://www.sixsigmaspc.com/six-sigma/cpk-vs-ppm.html